Showing results: 16 - 30 of 121 items found.
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31000R -
Chroma ATE Inc.
Cobra is the most advanced, compact,powerful temperature-forcing system on the market. Cobra is an adaptable solution to the ever-increasing thermal demands of post silicon validation and device characterization.
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7505-K006 -
Chroma ATE Inc.
The Chroma 7505-K006 Cylindrical Battery Cell Automated Optical Inspection System equipped with high-resolution camera can perform 2D defect detection that is suitable for inspecting various sizes of cylindrical batteries on the mainstream market.
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7505-K009 -
Chroma ATE Inc.
The Chroma 7505-K009 Inline Printing Quality Automated Optical Inspection System equipped with high-resolution camera can perform 2D defect detection that is suitable for Roll to Roll processing and on-line control. Both front and rear sides can be inspected at the same time.
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7505-02 -
Chroma ATE Inc.
The 7505-02 Automated Optical Inspection System is integrated with high speed camera to shoot Roll to Roll manufacturing processes of ITO (Indium Tin Oxide) film, RFID and FPC that is Line-scan Image Inspection System with PC-based structure.
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7980 -
Chroma ATE Inc.
Chroma 7980 Wafer Metrology System applies White Light Interference Measurement Technique to perform nondestructive and rapid surface profile measurement and analysis.
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7505-01 -
Chroma ATE Inc.
Chroma 7505-01 is the newest multi-function optical inspection system that equips with the capability of measuring 1D, 2D and 3D at the same time. Penetrating reflection measurement is used for 1D film thickness measurement to measure the non-destructive film thickness on transparent and translucent material.
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58620 -
Chroma ATE Inc.
The Chroma 58620 Laser Diode Characterization Station is a state-of-the-art full turnkey system specially designed for laser diode testing. Features range from macro inspection of the facet or aperture active area to a full suite of electro-optical parametic tests.
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7505-05 -
Chroma ATE Inc.
Recent advancement in optical inspection technology continues to find its path into a variety of market applications. Innovative automated optical testing has become essential and indispensable in areas such as effective dimensional measurement to ensure product manufacturability and process control.
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7945 -
Chroma ATE Inc.
Chroma 7945 wafer chip inspection system is an automated inspection system for pre and post diced patterned wafers. Change kits enable switching between various applications by allowing different carriers including metal frame or grip ring.
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EOS-JNX Series -
ADLINK Technology Inc.
The EOS-JNX series has a built-in Smart PoE feature to control PoE power remotely to reduce maintenance efforts in challenging environments and provides PoE power loss detection to alert of any unexpected PoE disconnection. The EOS-JNX-I is designed as an AI PoE switch for connecting to IP cameras to enable AI inferencing, and also provides an uplink port to connect to a network video recorder (NVR) for recording video streams, making upgrading existing surveillance systems easy. The EOS-JNX-G is designed for industrial AI machine vision applications, providing a dedicated bandwidth of 1Gb per channel with a GigE camera connection, which is crucial for production line and manufacturing applications.
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ADLINK Technology Inc.
Industrial Server-Grade System delivers a scalable high performance platform for a wide array of industrial applications.
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APU825-2 -
AIM GmbH
USB2.0 module with 2 CAN bus nodes ARINC825 compliant for testing and simulation of Avionic ARINC825/CAN bus systems.
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ADM-31 -
ALPHI Technology Corporation
The VME-based ADM31 data acquistion system supports up to 48 differential or up to 96 single-ended analog inputs. The ADM31 control card is an intelligent A/D subsystem master or slave device that controls the analog A/D cards. Up to two A/D cards can be configured with the control card to complete the A/D system.